| 1. | Simulation of fraunhofer diffraction phenomenon by fft
的衍射现象计算机仿真 |
| 2. | Study of fraunhofer diffraction from complementary sierpinski carpet grating
互补sierpinski地毯光栅夫琅和费衍射现象的研究 |
| 3. | When the diameter of the particles satisfied some conditions , mie theory is approximate to fraunhofer diffraction theory
当颗粒粒径满足一定条件时，米氏光散射可以用夫琅和费衍射来近似。 |
| 4. | To solve the problem , one of the main research work is to find a method which improve system based on fraunhofer diffraction
为克服这一点，探求在夫朗和费衍射系统基础上的改进方法是本论文的主要工作之一。 |
| 5. | By the way of numeriscal counting , fraunhofer diffraction are discussed , which can be aguide to computer analog of aptics experiment and digital image
摘要用数值计算方法，讨论了夫琅和费衍射特征，对光学实验的计算机模拟及数字成像有指导意义。 |
| 6. | This paper analyses light energy of fraunhofer diffraction of circular hole , and proves that the energy of airy disk is 84 % of light energy of normal incidence
摘要对圆孔夫琅禾费衍射光能量进行了定量分析，并证明了爱里斑能量?入射光能量的84 % 。 |
| 7. | A simulation experiments system on oip was made using matlab . the main contents are : ( 1 ) . some experiments for fraunhofer diffraction are simulated
本文提出了一种利用matlab软件仿真光学信息处理实验的方法并初步研制出仿真实验系统，主要内容如下： ( 1 ) |
| 8. | The measurement results to used the instrument based on the principle of fraunhofer diffraction are exact in the range of above 5 microns , but not of less than 5 microns
仅利用夫朗和费衍射原理的测粒技术虽然能对5微米以上的颗粒测量给出准确的结果，但对5微米以下的颗粒却很难实现准确的测量。 |
| 9. | The advantage of the simulation system is as following : by adjusting the experiment ' s parameters arbitrarily , the distribution of light intensity and the design of fraunhofer diffraction can be observed and analyzed
仿真实验的特点是：通过改变可调参数，得到相应的实验现象，方便于分析各种衍射屏的衍射特点。 |
| 10. | The sizing method based on fraunhofer diffraction is limited . because of the limitation of size parameter a ? 1 and size of photodetector , it ca n ' t measure the particles less than 5 microns accurately . to extending lower limit of measurement , inverse - fourier - transform technique is discussed
利用夫朗和费衍射理论时对粒子的界定要求尺寸参数a 1 ，又加上光电探测元件的尺寸受到限制，故不能准确地测量5微米以下的颗粒，为此必需扩大测量下限。 |
